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Energy dispersive X-ray fluorescence spectrometer EDX Series 800 HS (Shimadzu) is designed for rapid analysis of the elemental composition of the samples. Element detection range - from carbon to uranium. |
EDX spectrometer series designed for rapid non-destructive qualitative and quantitative determination of the elemental composition of solid and liquid samples , powders , granules, wafers , films.
Element detection range from C to U
- Large cuvette camera is designed for the analysis of samples with a diameter of 300 mm and a height of 150 mm.
- The software allows you to determine the thickness and elemental composition of thin films and coatings . Background method allows to analyze the fundamental parameters of the organic nature of the film .
- Five types of primary filters minimize the effect of the background , which increases the signal / noise ratio and improves detection limits of elements in samples of different nature.
- The program uses a library of mapping data and eliminates the need for standard samples for quantitative analysis.
- The assay can be conducted in air, vacuum or helium environment (for determination of light elements in liquids ) .
- Liquid nitrogen is only required at the time of measurement
- Digital Camera ( option) is designed to monitor the size of the sample analyzed in the research process .
- The use of collimators (optional) allows the analysis of micro- and defects in the samples as well as to reduce the background in the study of small-sized samples .
technical characteristics:
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Range of elements: |
6C – 92U |
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X-ray generator: |
anode tube with Rh, air cooling voltage 5 - 50 kV, current 1 - 1000 mA |
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The irradiated area: |
diameter 10 mm |
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Collimators (optional): |
automatic selection of four types: 1, 3, 5 and 10 mm, or 0.3, 1, 3 and 10 mm |
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detectors: |
Si (Li), the liquid nitrogen is only necessary for the measurement, the flow rate of 1 L / day |
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Sample compartment: |
- Analysis in air, vacuum or helium environment (optional) - 8 or 16-position autosampler - device for rotating the sample - a prefix for fine adjustment of the sample (optional) - a digital camera for observing the sample (optional) |
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Qualitative analysis: |
automatic and manual mode decryption peaks |
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Quantitative analysis: |
Method of calibration curves-matrix correction method of fundamental parameters (FP) - a method of background FP-analysis of thin films by FP |
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dimensions: |
580 х 650 х 420 мм |
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weight |
85 кг |